Microscopy using randomized speckle illumination
It is well known for structured illumination microscopy (SIM) that the lateral resolution by a factor of two beyond the classical diffraction limit is achieved using spatially structured illumination in wide-field fluorescence microscope. In the state of art SIM systems, grating patterns are general...
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| Main Authors: | , , |
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| 格式: | Article |
| 語言: | English |
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2019
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| 在線閱讀: | https://hdl.handle.net/10356/106440 http://hdl.handle.net/10220/49637 |
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