A time-delay-integration CMOS image sensor with pipelined charge transfer architecture

• Main Authors: Yu, Hang, Qian, Xinyuan, Chen, Shoushun, Low, Kay-Soon
• Other Authors: School of Electrical and Electronic Engineering
• Format: Conference or Workshop Item
• Language: English
• Published: 2013
• Subjects: DRNTU::Engineering::Mechanical engineering::Machine design and construction
• Online Access: https://hdl.handle.net/10356/106522; http://hdl.handle.net/10220/17624; http://dx.doi.org/10.1109/ISCAS.2012.6271566
• Institution: Nanyang Technological University

In this paper, we report a novel Time-Delay-Integration (TDI) CMOS image sensor for low-earth orbit (LEO) nano-satellite imaging application, where limited exposure time and unexpected flight fluctuations are major design challenges. The sensor features programmable integration time per stage, dynam...