Two-wavelength microscopic speckle interferometry using colour CCD camera
Single wavelength microscopic speckle interferometry is widely used for deformation, shape and non-destructive testing (NDT) of engineering structures. However the single wavelength configuration fails to quantify the large deformation due to the overcrowding of fringes and it cannot provide shape o...
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Main Authors: | , , , |
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Other Authors: | |
Format: | Conference or Workshop Item |
Language: | English |
Published: |
2015
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Subjects: | |
Online Access: | https://hdl.handle.net/10356/106900 http://hdl.handle.net/10220/25212 |
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Institution: | Nanyang Technological University |
Language: | English |
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