Reliability modeling and optimization of electronic circuits by stressor/susceptibility analysis

• Main Author: Ajith Abraham Padath
• Other Authors: Saratchandran, Paramasivan
• Format: Theses and Dissertations
• Language: English
• Published: 2008
• Subjects: DRNTU::Engineering::Electrical and electronic engineering::Electronic circuits
• Online Access: http://hdl.handle.net/10356/13349
• Institution: Nanyang Technological University

Reliability optimization requires models giving a direct relation between changeable design parameters and the reliability of a system . According to the conventional reliability prediction methods, optimization possibility for electronic circuits is by decreasing the temperature , load , voltage ,...