Reliability modeling and optimization of electronic circuits by stressor/susceptibility analysis

Reliability modeling and optimization of electronic circuits by stressor/susceptibility analysis

Reliability optimization requires models giving a direct relation between changeable design parameters and the reliability of a system . According to the conventional reliability prediction methods, optimization possibility for electronic circuits is by decreasing the temperature , load , voltage ,...

Full description

Saved in:
Bibliographic Details
Main Author: Ajith Abraham Padath
Other Authors: Saratchandran, Paramasivan
Format: Theses and Dissertations
Language:English
Published: 2008
Subjects:
DRNTU::Engineering::Electrical and electronic engineering::Electronic circuits
Online Access:http://hdl.handle.net/10356/13349
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: Nanyang Technological University
Language: English
id sg-ntu-dr.10356-13349
record_format dspace
spelling sg-ntu-dr.10356-133492023-07-04T15:13:14Z Reliability modeling and optimization of electronic circuits by stressor/susceptibility analysis Ajith Abraham Padath Saratchandran, Paramasivan School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering::Electronic circuits Reliability optimization requires models giving a direct relation between changeable design parameters and the reliability of a system . According to the conventional reliability prediction methods, optimization possibility for electronic circuits is by decreasing the temperature , load , voltage , changing application environment , part quality screening etc. which are hardly applicable and realized in practical situation . Master of Science (Computer Control and Automation) 2008-10-20T07:25:59Z 2008-10-20T07:25:59Z 1998 1998 Thesis http://hdl.handle.net/10356/13349 en 144 p. application/pdf
institution Nanyang Technological University
building NTU Library
continent Asia
country Singapore
Singapore
content_provider NTU Library
collection DR-NTU
language English
topic DRNTU::Engineering::Electrical and electronic engineering::Electronic circuits
spellingShingle DRNTU::Engineering::Electrical and electronic engineering::Electronic circuits
Ajith Abraham Padath
Reliability modeling and optimization of electronic circuits by stressor/susceptibility analysis
description Reliability optimization requires models giving a direct relation between changeable design parameters and the reliability of a system . According to the conventional reliability prediction methods, optimization possibility for electronic circuits is by decreasing the temperature , load , voltage , changing application environment , part quality screening etc. which are hardly applicable and realized in practical situation .
author2 Saratchandran, Paramasivan
author_facet Saratchandran, Paramasivan
Ajith Abraham Padath
format Theses and Dissertations
author Ajith Abraham Padath
author_sort Ajith Abraham Padath
title Reliability modeling and optimization of electronic circuits by stressor/susceptibility analysis
title_short Reliability modeling and optimization of electronic circuits by stressor/susceptibility analysis
title_full Reliability modeling and optimization of electronic circuits by stressor/susceptibility analysis
title_fullStr Reliability modeling and optimization of electronic circuits by stressor/susceptibility analysis
title_full_unstemmed Reliability modeling and optimization of electronic circuits by stressor/susceptibility analysis
title_sort reliability modeling and optimization of electronic circuits by stressor/susceptibility analysis
publishDate 2008
url http://hdl.handle.net/10356/13349
_version_ 1772827727506702336

Similar Items