Autonomous quality monitoring for complex manufacturing process

This research investigates the possibilities of using different types of incremental learning algorithms and deep neural networks to monitor the quality of products produced from the complex manufacturing process through binary and multi-class classification to identify defects quickly. To find o...

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Bibliographic Details
Main Author: Lee, Wen Siong
Other Authors: Mahardhika Pratama
Format: Final Year Project
Language:English
Published: Nanyang Technological University 2020
Subjects:
Online Access:https://hdl.handle.net/10356/138521
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Institution: Nanyang Technological University
Language: English