Autonomous quality monitoring for complex manufacturing process

• Main Author: Lee, Wen Siong
• Other Authors: Mahardhika Pratama
• Format: Final Year Project
• Language: English
• Published: Nanyang Technological University 2020
• Subjects: Engineering::Computer science and engineering
• Online Access: https://hdl.handle.net/10356/138521
• Institution: Nanyang Technological University

This research investigates the possibilities of using different types of incremental learning algorithms and deep neural networks to monitor the quality of products produced from the complex manufacturing process through binary and multi-class classification to identify defects quickly. To find o...