Nitrogen-mediated aligned growth of hexagonal BN films for reliable high-performance InSe transistors
Orientation controlled hexagonal boron nitride (h-BN) films exhibit excellent mechanical and thermal properties, making them attractive for diverse applications. However, wafer-scale synthesis of vertically oriented h-BN films is still a significant challenge. Herein, utilizing high power impulse ma...
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sg-ntu-dr.10356-1394262020-05-19T07:51:50Z Nitrogen-mediated aligned growth of hexagonal BN films for reliable high-performance InSe transistors Chng, Soon Siang Zhu, Minmin Wu, Jing Wang, Xizu Ng, Zhi Kai Zhang, Keke Liu, Chongyang Shakerzadeh, Maziar Tsang, Siuhon Teo, Edwin Hang Tong School of Electrical and Electronic Engineering Temasek Laboratories Engineering::Electrical and electronic engineering Engineering::Materials::Microelectronics and semiconductor materials::Thin films Hexagonal Boron Nitride Indium Selenide Transistors Orientation controlled hexagonal boron nitride (h-BN) films exhibit excellent mechanical and thermal properties, making them attractive for diverse applications. However, wafer-scale synthesis of vertically oriented h-BN films is still a significant challenge. Herein, utilizing high power impulse magnetron sputtering (HIPIMS) of up to around 500 W, a series of h-BN thin films have been directly deposited on silicon wafers in various nitrogen environments. Our analyses reveal that the degree of microstructure alignment of the as-grown films strongly depends on the nitrogen gas flow ratio. Between 20% to 40% gas flow ratios, defined to be the ratio of the nitrogen gas flow rate to the total gas flow rate of nitrogen and argon, the film attained its maximum alignment as measured by the R value. Correspondingly, the maximum thermal conductivity of the films occurs in the same region and the value ranges from 0.5 to 1.5 W m−1 K−1. Interestingly, such a BN-encapsulated InSe transistor shows a typical semiconductor characteristic and works well even after 2 months or longer. Additionally, the InSe transistor exhibits electro-dominated transport with high mobility (71.0 cm2 V−1 s−1) and performs well up to 200 °C. Our study suggests that alignment engineering in h-BN samples is plausible for thermal performance enhancement, which can broaden the thermal management applications in electrical and optoelectronic fields. NRF (Natl Research Foundation, S’pore) ASTAR (Agency for Sci., Tech. and Research, S’pore) Accepted version 2020-05-19T07:47:51Z 2020-05-19T07:47:51Z 2020 Journal Article Chng, S. S., Zhu, M., Wu, J., Wang, X., Ng, Z. K., Zhang, K., . . . Teo, E. H. T. (2020). Nitrogen-mediated aligned growth of hexagonal BN films for reliable high-performance InSe transistors. Journal of Materials Chemistry C, 8(13), 4421-4431. doi:10.1039/C9TC06733G 2050-7526 https://hdl.handle.net/10356/139426 10.1039/C9TC06733G 13 8 4421 4431 en Journal of Materials Chemistry C © 2020 The Royal Society of Chemistry. All rights reserved. This paper was published in Journal of Materials Chemistry C and is made available with permission of The Royal Society of Chemistry. application/pdf |
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Engineering::Electrical and electronic engineering Engineering::Materials::Microelectronics and semiconductor materials::Thin films Hexagonal Boron Nitride Indium Selenide Transistors Chng, Soon Siang Zhu, Minmin Wu, Jing Wang, Xizu Ng, Zhi Kai Zhang, Keke Liu, Chongyang Shakerzadeh, Maziar Tsang, Siuhon Teo, Edwin Hang Tong Nitrogen-mediated aligned growth of hexagonal BN films for reliable high-performance InSe transistors |
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Orientation controlled hexagonal boron nitride (h-BN) films exhibit excellent mechanical and thermal properties, making them attractive for diverse applications. However, wafer-scale synthesis of vertically oriented h-BN films is still a significant challenge. Herein, utilizing high power impulse magnetron sputtering (HIPIMS) of up to around 500 W, a series of h-BN thin films have been directly deposited on silicon wafers in various nitrogen environments. Our analyses reveal that the degree of microstructure alignment of the as-grown films strongly depends on the nitrogen gas flow ratio. Between 20% to 40% gas flow ratios, defined to be the ratio of the nitrogen gas flow rate to the total gas flow rate of nitrogen and argon, the film attained its maximum alignment as measured by the R value. Correspondingly, the maximum thermal conductivity of the films occurs in the same region and the value ranges from 0.5 to 1.5 W m−1 K−1. Interestingly, such a BN-encapsulated InSe transistor shows a typical semiconductor characteristic and works well even after 2 months or longer. Additionally, the InSe transistor exhibits electro-dominated transport with high mobility (71.0 cm2 V−1 s−1) and performs well up to 200 °C. Our study suggests that alignment engineering in h-BN samples is plausible for thermal performance enhancement, which can broaden the thermal management applications in electrical and optoelectronic fields. |
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School of Electrical and Electronic Engineering |
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School of Electrical and Electronic Engineering Chng, Soon Siang Zhu, Minmin Wu, Jing Wang, Xizu Ng, Zhi Kai Zhang, Keke Liu, Chongyang Shakerzadeh, Maziar Tsang, Siuhon Teo, Edwin Hang Tong |
format |
Article |
author |
Chng, Soon Siang Zhu, Minmin Wu, Jing Wang, Xizu Ng, Zhi Kai Zhang, Keke Liu, Chongyang Shakerzadeh, Maziar Tsang, Siuhon Teo, Edwin Hang Tong |
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Chng, Soon Siang |
title |
Nitrogen-mediated aligned growth of hexagonal BN films for reliable high-performance InSe transistors |
title_short |
Nitrogen-mediated aligned growth of hexagonal BN films for reliable high-performance InSe transistors |
title_full |
Nitrogen-mediated aligned growth of hexagonal BN films for reliable high-performance InSe transistors |
title_fullStr |
Nitrogen-mediated aligned growth of hexagonal BN films for reliable high-performance InSe transistors |
title_full_unstemmed |
Nitrogen-mediated aligned growth of hexagonal BN films for reliable high-performance InSe transistors |
title_sort |
nitrogen-mediated aligned growth of hexagonal bn films for reliable high-performance inse transistors |
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2020 |
url |
https://hdl.handle.net/10356/139426 |
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1681057909205630976 |