Resistive switching devices based on halide perovskites
Resistance switching is a relatively new phenomenon that has been incorporated into fabricating non-volatile memory. Resistive random-access memory was the proposed future developments that utilize the resistance switching characteristic to replace flash memory. Thus, multiple researches were invest...
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sg-ntu-dr.10356-1401782023-07-07T18:40:20Z Resistive switching devices based on halide perovskites Cheong, Cheng Hao Ang Diing Shenp School of Electrical and Electronic Engineering Zviad Tsakadze EDSAng@ntu.edu.sg Engineering::Electrical and electronic engineering::Microelectronics Engineering::Electrical and electronic engineering::Optics, optoelectronics, photonics Resistance switching is a relatively new phenomenon that has been incorporated into fabricating non-volatile memory. Resistive random-access memory was the proposed future developments that utilize the resistance switching characteristic to replace flash memory. Thus, multiple researches were invested to experiment with the components to achieve the desired switching characteristic. Halide perovskites have attracted attention due to their versatile properties, sensitivity to light, and low fabrication cost. Inorganic halide perovskites that is environmentally friendly, air-stable, and non-toxic was researched, developed and further experiment to achieve the ideal resistive switching characteristic. Silver-Bismuth-Iodine is an inorganic halide perovskites ternary system, it is a solution based processable material which is both inexpensive and easy to manufacture. After several experiments conducted, an observation made was that there was poor I-V characteristic curves and poor topology coverage by the perovskite film. Therefore, by utilizing the Surface profiler Veeco Dektak 150 to examine the film quality, multiple particles on the switching layer itself was discovered. After using EDS analysis on the particles, a discovery made was that the particles are undissolved precursor colloids which may explain the poor I-V characteristic curve as the particles may exhibit unusual behavior and due to the poor solubility of the precursor resulting the crystallization of the perovskites to be limited hence, causing poor coverage and reduced thickness of the film. There will be another study made by another student on improving the thickness of the film. The focus of this report is the fabrication of resistive switching devices and to improve the solubility and investigate the effect on the reduction in particle count and coverage. Bachelor of Engineering (Electrical and Electronic Engineering) 2020-05-27T04:29:50Z 2020-05-27T04:29:50Z 2020 Final Year Project (FYP) https://hdl.handle.net/10356/140178 en A2017-191 application/pdf Nanyang Technological University |
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Engineering::Electrical and electronic engineering::Microelectronics Engineering::Electrical and electronic engineering::Optics, optoelectronics, photonics Cheong, Cheng Hao Resistive switching devices based on halide perovskites |
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Resistance switching is a relatively new phenomenon that has been incorporated into fabricating non-volatile memory. Resistive random-access memory was the proposed future developments that utilize the resistance switching characteristic to replace flash memory. Thus, multiple researches were invested to experiment with the components to achieve the desired switching characteristic. Halide perovskites have attracted attention due to their versatile properties, sensitivity to light, and low fabrication cost. Inorganic halide perovskites that is environmentally friendly, air-stable, and non-toxic was researched, developed and further experiment to achieve the ideal resistive switching characteristic. Silver-Bismuth-Iodine is an inorganic halide perovskites ternary system, it is a solution based processable material which is both inexpensive and easy to manufacture. After several experiments conducted, an observation made was that there was poor I-V characteristic curves and poor topology coverage by the perovskite film. Therefore, by utilizing the Surface profiler Veeco Dektak 150 to examine the film quality, multiple particles on the switching layer itself was discovered. After using EDS analysis on the particles, a discovery made was that the particles are undissolved precursor colloids which may explain the poor I-V characteristic curve as the particles may exhibit unusual behavior and due to the poor solubility of the precursor resulting the crystallization of the perovskites to be limited hence, causing poor coverage and reduced thickness of the film. There will be another study made by another student on improving the thickness of the film. The focus of this report is the fabrication of resistive switching devices and to improve the solubility and investigate the effect on the reduction in particle count and coverage. |
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Ang Diing Shenp |
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Ang Diing Shenp Cheong, Cheng Hao |
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Final Year Project |
author |
Cheong, Cheng Hao |
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Cheong, Cheng Hao |
title |
Resistive switching devices based on halide perovskites |
title_short |
Resistive switching devices based on halide perovskites |
title_full |
Resistive switching devices based on halide perovskites |
title_fullStr |
Resistive switching devices based on halide perovskites |
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Resistive switching devices based on halide perovskites |
title_sort |
resistive switching devices based on halide perovskites |
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Nanyang Technological University |
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2020 |
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https://hdl.handle.net/10356/140178 |
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