Machine learning models for patent examination

• Main Author: Wang, Yanqing
• Other Authors: Lihui CHEN
• Format: Thesis-Master by Coursework
• Language: English
• Published: Nanyang Technological University 2020
• Subjects: Engineering::Computer science and engineering::Computer systems organization::Computer-communication networks
• Online Access: https://hdl.handle.net/10356/141313
• Institution: Nanyang Technological University

This year, text classification remains one of the most attractive research topics in the field of NLP(Natural Language Processing). Due to the complexity of patent classification, Patent Examination is still inseparable from the examiners, which makes the efficiency of Patent Examination ineffici...