Local large-margin multi-metric learning for face and kinship verification

• Main Authors: Hu, Junlin, Lu, Jiwen, Tan, Yap-Peng, Yuan, Junsong, Zhou, Jie
• 其他作者: School of Electrical and Electronic Engineering
• 格式: Article
• 語言: English
• 出版: 2020
• 主題: Engineering::Electrical and electronic engineering; Local Metric Learning; Multi-metric Learning
• 在線閱讀: https://hdl.handle.net/10356/142210
• 機構: Nanyang Technological University

Metric learning has attracted wide attention in face and kinship verification, and a number of such algorithms have been presented over the past few years. However, most existing metric learning methods learn only one Mahalanobis distance metric from a single feature representation for each face ima...