Material characterizations of high refractive films for active waveguide

The fabrication of SiON and Erbium (Er) doped SiON films have been successfully developed using the sputtering and co-sputtering techniques. The properties of the films such as the optical properties, the compositions, the chemical bonds and the microstructures, have been well characterized and s...

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書目詳細資料
主要作者: Kantisara Pita.
其他作者: School of Electrical and Electronic Engineering
格式: Research Report
語言:English
出版: 2008
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在線閱讀:http://hdl.handle.net/10356/14234
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