Long working distance high resolution reflective sample imaging via structured embedded speckle illumination

• المؤلفون الرئيسيون: Haridas, Aswin, Perinchery, Sandeep Menon, Shinde, Anant, Buchnev, Oleksandr, Murukeshan, Vadakke Matham
• مؤلفون آخرون: School of Mechanical and Aerospace Engineering
• التنسيق: مقال
• اللغة: English
• منشور في: 2020
• الموضوعات: Engineering::Mechanical engineering; High Resolution Imaging; Long Working Distance Imaging
• الوصول للمادة أونلاين: https://hdl.handle.net/10356/144023
• المؤسسة: Nanyang Technological University

Imaging beyond the diffraction limit at longer working distances using enhanced microscopic configurations has always been a challenge for biological and engineering samples. Even though multiple techniques have been widely used for sub-diffraction limit resolution imaging, the achievable resolution...