Long working distance high resolution reflective sample imaging via structured embedded speckle illumination

Long working distance high resolution reflective sample imaging via structured embedded speckle illumination

Imaging beyond the diffraction limit at longer working distances using enhanced microscopic configurations has always been a challenge for biological and engineering samples. Even though multiple techniques have been widely used for sub-diffraction limit resolution imaging, the achievable resolution...

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書目詳細資料
Main Authors:	Haridas, Aswin, Perinchery, Sandeep Menon, Shinde, Anant, Buchnev, Oleksandr, Murukeshan, Vadakke Matham
其他作者:	School of Mechanical and Aerospace Engineering
格式:	Article
語言:	English
出版:	2020
主題:	Engineering::Mechanical engineering High Resolution Imaging Long Working Distance Imaging
在線閱讀:	https://hdl.handle.net/10356/144023
標簽:	添加標簽沒有標簽, 成為第一個標記此記錄!
機構:	Nanyang Technological University
語言:	English

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