Application of phase shifting electronic speckle pattern interferometry in studies of photoinduced shrinkage of photopolymer layers

Application of phase shifting electronic speckle pattern interferometry in studies of photoinduced shrinkage of photopolymer layers

Photoinduced shrinkage occurring in photopolymer layers during holographic recording was determined by phase shifting electronic speckle pattern interferometry. Phase maps were calculated from the changes in intensity at each pixel due to the phase differences introduced between object and reference...

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Main Authors: Moothanchery, Mohesh, Bavigadda, Viswanath, Pramanik, Manojit, Toal, Vincent, Naydenova, Izabela
Other Authors: School of Chemical and Biomedical Engineering
Format: Article
Language:English
Published: 2021
Subjects:
Engineering::Bioengineering
Photopolymer Layers
Phase Shifting Electronic Speckle Pattern Interferometry
Online Access:https://hdl.handle.net/10356/146487
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Institution: Nanyang Technological University
Language: English
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spelling sg-ntu-dr.10356-1464872023-12-29T06:54:32Z Application of phase shifting electronic speckle pattern interferometry in studies of photoinduced shrinkage of photopolymer layers Moothanchery, Mohesh Bavigadda, Viswanath Pramanik, Manojit Toal, Vincent Naydenova, Izabela School of Chemical and Biomedical Engineering Engineering::Bioengineering Photopolymer Layers Phase Shifting Electronic Speckle Pattern Interferometry Photoinduced shrinkage occurring in photopolymer layers during holographic recording was determined by phase shifting electronic speckle pattern interferometry. Phase maps were calculated from the changes in intensity at each pixel due to the phase differences introduced between object and reference beams. Shrinkage was then obtained from the changes in phase as recording proceeded. The technique allows for whole field measurement of the dimensional changes in photopolymers during holographic recording. Ministry of Education (MOE) Published version The authors would also like to acknowledge the financial support from Tier 2 grant funded by the Ministry of Education in Singapore (ARC2/15: M4020238). 2021-02-18T08:37:29Z 2021-02-18T08:37:29Z 2017 Journal Article Moothanchery, M., Bavigadda, V., Pramanik, M., Toal, V., & Naydenova, I. (2017). Application of phase shifting electronic speckle pattern interferometry in studies of photoinduced shrinkage of photopolymer layers. Optics Express, 25(9), 9647-9653. doi:10.1364/OE.25.009647 1094-4087 https://hdl.handle.net/10356/146487 10.1364/OE.25.009647 28468347 2-s2.0-85018359656 9 25 9647 9653 en Optics Express © 2017 Optical Society of America. This is an open-access article distributed under the terms of the Creative Commons Attribution License. application/pdf
institution Nanyang Technological University
building NTU Library
continent Asia
country Singapore
Singapore
content_provider NTU Library
collection DR-NTU
language English
topic Engineering::Bioengineering
Photopolymer Layers
Phase Shifting Electronic Speckle Pattern Interferometry
spellingShingle Engineering::Bioengineering
Photopolymer Layers
Phase Shifting Electronic Speckle Pattern Interferometry
Moothanchery, Mohesh
Bavigadda, Viswanath
Pramanik, Manojit
Toal, Vincent
Naydenova, Izabela
Application of phase shifting electronic speckle pattern interferometry in studies of photoinduced shrinkage of photopolymer layers
description Photoinduced shrinkage occurring in photopolymer layers during holographic recording was determined by phase shifting electronic speckle pattern interferometry. Phase maps were calculated from the changes in intensity at each pixel due to the phase differences introduced between object and reference beams. Shrinkage was then obtained from the changes in phase as recording proceeded. The technique allows for whole field measurement of the dimensional changes in photopolymers during holographic recording.
author2 School of Chemical and Biomedical Engineering
author_facet School of Chemical and Biomedical Engineering
Moothanchery, Mohesh
Bavigadda, Viswanath
Pramanik, Manojit
Toal, Vincent
Naydenova, Izabela
format Article
author Moothanchery, Mohesh
Bavigadda, Viswanath
Pramanik, Manojit
Toal, Vincent
Naydenova, Izabela
author_sort Moothanchery, Mohesh
title Application of phase shifting electronic speckle pattern interferometry in studies of photoinduced shrinkage of photopolymer layers
title_short Application of phase shifting electronic speckle pattern interferometry in studies of photoinduced shrinkage of photopolymer layers
title_full Application of phase shifting electronic speckle pattern interferometry in studies of photoinduced shrinkage of photopolymer layers
title_fullStr Application of phase shifting electronic speckle pattern interferometry in studies of photoinduced shrinkage of photopolymer layers
title_full_unstemmed Application of phase shifting electronic speckle pattern interferometry in studies of photoinduced shrinkage of photopolymer layers
title_sort application of phase shifting electronic speckle pattern interferometry in studies of photoinduced shrinkage of photopolymer layers
publishDate 2021
url https://hdl.handle.net/10356/146487
_version_ 1787136820999356416

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