Stability study of non-volatile memory content under different temperature conditions

• Main Author: Siow, Jia Wei
• Other Authors: Gan Chee Lip
• Format: Final Year Project
• Language: English
• Published: Nanyang Technological University 2021
• Subjects: Engineering::Materials::Microelectronics and semiconductor materials
• Online Access: https://hdl.handle.net/10356/147720
• Institution: Nanyang Technological University

Non-Volatile Memory (NVM) devices store data in floating gates in binary form with electrical charges. Continuous improvement of device technology has led to a reduction in size of the transistors over the years. In this report, experiments were carried out to determine the temperature at which the...