A new lightweight in-situ adversarial sample detector for edge deep neural network

• Main Authors: Wang, Si, Liu, Wenye, Chang, Chip-Hong
• Other Authors: School of Electrical and Electronic Engineering
• Format: Article
• Language: English
• Published: 2021
• Subjects: Engineering; Edge AI Security; Adversarial Examples
• Online Access: https://hdl.handle.net/10356/148567
• Institution: Nanyang Technological University

The flourishing of Internet of Things (IoT) has rekindled on-premise computing to allow data to be analyzed closer to the source. To support edge Artificial Intelligence (AI), hardware accelerators, open-source AI model compilers and commercially available toolkits have evolved to facilitate the de...