Adversarial sample detection for deep neural network through model mutation testing

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Bibliographic Details
Main Authors: WANG, Jingyi, DONG, Guoliang, SUN, Jun, WANG, Xinyu, PEIXIN, Zhang
Format: text
Language:English
Published: Institutional Knowledge at Singapore Management University 2019
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Online Access:https://ink.library.smu.edu.sg/sis_research/4635
https://ink.library.smu.edu.sg/context/sis_research/article/5638/viewcontent/1812.05793.pdf
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Institution: Singapore Management University
Language: English