Adversarial sample detection for deep neural network through model mutation testing

Adversarial sample detection for deep neural network through model mutation testing

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Bibliographic Details
Main Authors:	WANG, Jingyi, DONG, Guoliang, SUN, Jun, WANG, Xinyu, PEIXIN, Zhang
Format:	text
Language:	English
Published:	Institutional Knowledge at Singapore Management University 2019
Subjects:	Information Security
Online Access:	https://ink.library.smu.edu.sg/sis_research/4635 https://ink.library.smu.edu.sg/context/sis_research/article/5638/viewcontent/1812.05793.pdf
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Institution:	Singapore Management University
Language:	English

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