Adversarial sample detection for deep neural network through model mutation testing

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Main Authors:	WANG, Jingyi, DONG, Guoliang, SUN, Jun, WANG, Xinyu, PEIXIN, Zhang
Format:	text
Language:	English
Published:	Institutional Knowledge at Singapore Management University 2019
Subjects:	Information Security
Online Access:	https://ink.library.smu.edu.sg/sis_research/4635 https://ink.library.smu.edu.sg/context/sis_research/article/5638/viewcontent/1812.05793.pdf
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Institution:	Singapore Management University
Language:	English

id	sg-smu-ink.sis_research-5638
record_format	dspace
spelling	sg-smu-ink.sis_research-56382020-01-02T08:32:39Z Adversarial sample detection for deep neural network through model mutation testing WANG, Jingyi DONG, Guoliang SUN, Jun WANG, Xinyu PEIXIN, Zhang 2019-05-01T07:00:00Z text application/pdf https://ink.library.smu.edu.sg/sis_research/4635 https://ink.library.smu.edu.sg/context/sis_research/article/5638/viewcontent/1812.05793.pdf http://creativecommons.org/licenses/by-nc-nd/4.0/ Research Collection School Of Computing and Information Systems eng Institutional Knowledge at Singapore Management University Information Security
institution	Singapore Management University
building	SMU Libraries
continent	Asia
country	Singapore Singapore
content_provider	SMU Libraries
collection	InK@SMU
language	English
topic	Information Security
spellingShingle	Information Security WANG, Jingyi DONG, Guoliang SUN, Jun WANG, Xinyu PEIXIN, Zhang Adversarial sample detection for deep neural network through model mutation testing
format	text
author	WANG, Jingyi DONG, Guoliang SUN, Jun WANG, Xinyu PEIXIN, Zhang
author_facet	WANG, Jingyi DONG, Guoliang SUN, Jun WANG, Xinyu PEIXIN, Zhang
author_sort	WANG, Jingyi
title	Adversarial sample detection for deep neural network through model mutation testing
title_short	Adversarial sample detection for deep neural network through model mutation testing
title_full	Adversarial sample detection for deep neural network through model mutation testing
title_fullStr	Adversarial sample detection for deep neural network through model mutation testing
title_full_unstemmed	Adversarial sample detection for deep neural network through model mutation testing
title_sort	adversarial sample detection for deep neural network through model mutation testing
publisher	Institutional Knowledge at Singapore Management University
publishDate	2019
url	https://ink.library.smu.edu.sg/sis_research/4635 https://ink.library.smu.edu.sg/context/sis_research/article/5638/viewcontent/1812.05793.pdf
_version_	1770574944957104128

Adversarial sample detection for deep neural network through model mutation testing

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