IEMI risk analysis for IoT-based devices

Concepts on the impact IEMI can have on IoT devices

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Bibliographic Details
Main Author: Ong, Han Jie
Other Authors: See Kye Yak
Format: Final Year Project
Language:English
Published: Nanyang Technological University 2021
Subjects:
Online Access:https://hdl.handle.net/10356/149134
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Institution: Nanyang Technological University
Language: English