IEMI risk analysis for IoT-based devices

Concepts on the impact IEMI can have on IoT devices

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Bibliographic Details
Main Author: Ong, Han Jie
Other Authors: See Kye Yak
Format: Final Year Project
Language:English
Published: Nanyang Technological University 2021
Subjects:
Online Access:https://hdl.handle.net/10356/149134
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Institution: Nanyang Technological University
Language: English
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spelling sg-ntu-dr.10356-1491342023-07-07T17:40:57Z IEMI risk analysis for IoT-based devices Ong, Han Jie See Kye Yak School of Electrical and Electronic Engineering EKYSEE@ntu.edu.sg Engineering::Electrical and electronic engineering Concepts on the impact IEMI can have on IoT devices Bachelor of Engineering (Electrical and Electronic Engineering) 2021-05-27T06:01:11Z 2021-05-27T06:01:11Z 2021 Final Year Project (FYP) Ong, H. J. (2021). IEMI risk analysis for IoT-based devices. Final Year Project (FYP), Nanyang Technological University, Singapore. https://hdl.handle.net/10356/149134 https://hdl.handle.net/10356/149134 en A2183-201 application/pdf Nanyang Technological University
institution Nanyang Technological University
building NTU Library
continent Asia
country Singapore
Singapore
content_provider NTU Library
collection DR-NTU
language English
topic Engineering::Electrical and electronic engineering
spellingShingle Engineering::Electrical and electronic engineering
Ong, Han Jie
IEMI risk analysis for IoT-based devices
description Concepts on the impact IEMI can have on IoT devices
author2 See Kye Yak
author_facet See Kye Yak
Ong, Han Jie
format Final Year Project
author Ong, Han Jie
author_sort Ong, Han Jie
title IEMI risk analysis for IoT-based devices
title_short IEMI risk analysis for IoT-based devices
title_full IEMI risk analysis for IoT-based devices
title_fullStr IEMI risk analysis for IoT-based devices
title_full_unstemmed IEMI risk analysis for IoT-based devices
title_sort iemi risk analysis for iot-based devices
publisher Nanyang Technological University
publishDate 2021
url https://hdl.handle.net/10356/149134
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