IEMI risk analysis for IoT-based devices
Concepts on the impact IEMI can have on IoT devices
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Language: | English |
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Nanyang Technological University
2021
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Online Access: | https://hdl.handle.net/10356/149134 |
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sg-ntu-dr.10356-1491342023-07-07T17:40:57Z IEMI risk analysis for IoT-based devices Ong, Han Jie See Kye Yak School of Electrical and Electronic Engineering EKYSEE@ntu.edu.sg Engineering::Electrical and electronic engineering Concepts on the impact IEMI can have on IoT devices Bachelor of Engineering (Electrical and Electronic Engineering) 2021-05-27T06:01:11Z 2021-05-27T06:01:11Z 2021 Final Year Project (FYP) Ong, H. J. (2021). IEMI risk analysis for IoT-based devices. Final Year Project (FYP), Nanyang Technological University, Singapore. https://hdl.handle.net/10356/149134 https://hdl.handle.net/10356/149134 en A2183-201 application/pdf Nanyang Technological University |
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Engineering::Electrical and electronic engineering Ong, Han Jie IEMI risk analysis for IoT-based devices |
description |
Concepts on the impact IEMI can have on IoT devices |
author2 |
See Kye Yak |
author_facet |
See Kye Yak Ong, Han Jie |
format |
Final Year Project |
author |
Ong, Han Jie |
author_sort |
Ong, Han Jie |
title |
IEMI risk analysis for IoT-based devices |
title_short |
IEMI risk analysis for IoT-based devices |
title_full |
IEMI risk analysis for IoT-based devices |
title_fullStr |
IEMI risk analysis for IoT-based devices |
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IEMI risk analysis for IoT-based devices |
title_sort |
iemi risk analysis for iot-based devices |
publisher |
Nanyang Technological University |
publishDate |
2021 |
url |
https://hdl.handle.net/10356/149134 |
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1772828313711017984 |