IEMI risk analysis for IoT-based devices
Concepts on the impact IEMI can have on IoT devices
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Main Author: | Ong, Han Jie |
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Other Authors: | See Kye Yak |
Format: | Final Year Project |
Language: | English |
Published: |
Nanyang Technological University
2021
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Subjects: | |
Online Access: | https://hdl.handle.net/10356/149134 |
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Institution: | Nanyang Technological University |
Language: | English |
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