On reliability analysis of smart grids under topology attacks : a stochastic Petri net approach

Building an efficient, smart, and multifunctional power grid while maintaining high reliability and security is an extremely challenging task, particularly in the ever-evolving cyber threat landscape. The challenge is also compounded by the increasing complexity of power grids in both cyber and phys...

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Main Authors: Li, Beibei, Lu, Rongxing, Choo, Raymond Kim-Kwang, Wang, Wei, Luo, Sheng
其他作者: School of Electrical and Electronic Engineering
格式: Article
語言:English
出版: 2021
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在線閱讀:https://hdl.handle.net/10356/150294
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