On reliability analysis of smart grids under topology attacks : a stochastic Petri net approach
Building an efficient, smart, and multifunctional power grid while maintaining high reliability and security is an extremely challenging task, particularly in the ever-evolving cyber threat landscape. The challenge is also compounded by the increasing complexity of power grids in both cyber and phys...
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Main Authors: | Li, Beibei, Lu, Rongxing, Choo, Raymond Kim-Kwang, Wang, Wei, Luo, Sheng |
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Other Authors: | School of Electrical and Electronic Engineering |
Format: | Article |
Language: | English |
Published: |
2021
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Subjects: | |
Online Access: | https://hdl.handle.net/10356/150294 |
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Institution: | Nanyang Technological University |
Language: | English |
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