On reliability analysis of smart grids under topology attacks : a stochastic Petri net approach

• Main Authors: Li, Beibei, Lu, Rongxing, Choo, Raymond Kim-Kwang, Wang, Wei, Luo, Sheng
• Other Authors: School of Electrical and Electronic Engineering
• Format: Article
• Language: English
• Published: 2021
• Subjects: Engineering::Electrical and electronic engineering; Cyber-physical Systems; Smart Grids
• Online Access: https://hdl.handle.net/10356/150294
• Institution: Nanyang Technological University

Building an efficient, smart, and multifunctional power grid while maintaining high reliability and security is an extremely challenging task, particularly in the ever-evolving cyber threat landscape. The challenge is also compounded by the increasing complexity of power grids in both cyber and phys...