A hierarchical multiclassifier system for automated analysis of delayered IC images
A robust and accurate machine learning based hierarchical multiclassifier system is proposed to automate the retrieval of interconnection information from delayered integrated circuits images. The proposed system replaces labor-intensive manual annotation process and provides an effective approach f...
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Main Authors: | , , , , |
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Other Authors: | |
Format: | Article |
Language: | English |
Published: |
2021
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Subjects: | |
Online Access: | https://hdl.handle.net/10356/150807 |
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Institution: | Nanyang Technological University |
Language: | English |
Summary: | A robust and accurate machine learning based hierarchical multiclassifier system is proposed to automate the retrieval of interconnection information from delayered integrated circuits images. The proposed system replaces labor-intensive manual annotation process and provides an effective approach for the automated analysis of state-of-the-art deep submicron IC chips. |
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