Building an intelligent e-diagnostics system for reducing mean time to repair (MTTR) of wire bond machines

In today's cost driven semiconductor industry, utilizing the available capacity to its maximum limits is of prime importance for being competitive. With the equipments being expensive and the technology changing very fast, utilization of the available resources, by minimizing the repair time b...

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Bibliographic Details
Main Authors: Sunil, Bhandari, Du, Xian, Wang, Xiaobo
Other Authors: Appa Iyer Sivakumar
Format: Theses and Dissertations
Language:English
Published: 2009
Subjects:
Online Access:http://hdl.handle.net/10356/15186
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Institution: Nanyang Technological University
Language: English