Defect characterization of materials' surface using Python

• 主要作者: Teo, Jack
• 其他作者: Radhakrishnan K
• 格式: Final Year Project
• 語言: English
• 出版: Nanyang Technological University 2022
• 主題: Engineering::Electrical and electronic engineering::Semiconductors
• 在線閱讀: https://hdl.handle.net/10356/157414
• 機構: Nanyang Technological University

Gallium nitride semiconductor (GaN) has become popular over the past few years. GaN based devices can be found in a charger, electric vehicles, and the latest 5G network. GaN layer could be grown on a different substrate such as Silicon (Si) and Silicon Carbide (SiC). However, growing GaN on diffe...