Defect characterization of materials' surface using Python
Gallium nitride semiconductor (GaN) has become popular over the past few years. GaN based devices can be found in a charger, electric vehicles, and the latest 5G network. GaN layer could be grown on a different substrate such as Silicon (Si) and Silicon Carbide (SiC). However, growing GaN on diffe...
Saved in:
Main Author: | Teo, Jack |
---|---|
Other Authors: | Radhakrishnan K |
Format: | Final Year Project |
Language: | English |
Published: |
Nanyang Technological University
2022
|
Subjects: | |
Online Access: | https://hdl.handle.net/10356/157414 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | Nanyang Technological University |
Language: | English |
Similar Items
-
Defect characterization of GaN-based materials’ surface using Python
by: Ng, Shawn Jun Kai
Published: (2023) -
Defect characterization of materials' surface using Python
by: Khine Mya Phyu Tun
Published: (2022) -
Crystal defect characterization using Python
by: Zayar Naung
Published: (2021) -
Surface analysis of semiconductors and simulation using Python
by: Menon, Krishnanunni
Published: (2022) -
Junction depth & defect characterization with the use of EBIC
by: Phua, Poh Chin.
Published: (2008)