A small step towards solving the global chip shortage problem – physical failure analysis

• Main Author: Tan, Yi Kai
• Other Authors: Gan Chee Lip
• Format: Final Year Project
• Language: English
• Published: Nanyang Technological University 2022
• Subjects: Engineering::Materials::Microelectronics and semiconductor materials::Nanoelectronics and interconnects; Engineering::Electrical and electronic engineering::Microelectronics
• Online Access: https://hdl.handle.net/10356/161581
• Institution: Nanyang Technological University

Driven by an insatiable demand for Integrated Circuits (ICs) from massive industries and supply chain disruptions due to the Covid-19 pandemic, a global chip shortage has emerged in recent years. In response, the Physical Failure Analysis (PFA) of defective ICs has been explored to improve productio...