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A physics-based model for crystal orientation dictionary indexing by directional reflectance microscopy

Directional reflectance microscopy (DRM) is a new optical technique that enables grain orientation mapping in crystalline solids by capturing and analyzing light reflectance signals generated by chemically etched surfaces. Currently, orientation indexing by DRM relies on fitting the optical signals...

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Main Authors: Zhu, Chenyang, Seita, Matteo
其他作者: School of Mechanical and Aerospace Engineering
格式: Article
語言:English
出版: 2022
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在線閱讀:https://hdl.handle.net/10356/162146
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機構: Nanyang Technological University
語言: English