A physics-based model for crystal orientation dictionary indexing by directional reflectance microscopy

Directional reflectance microscopy (DRM) is a new optical technique that enables grain orientation mapping in crystalline solids by capturing and analyzing light reflectance signals generated by chemically etched surfaces. Currently, orientation indexing by DRM relies on fitting the optical signals...

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Bibliographic Details
Main Authors: Zhu, Chenyang, Seita, Matteo
Other Authors: School of Mechanical and Aerospace Engineering
Format: Article
Language:English
Published: 2022
Subjects:
Online Access:https://hdl.handle.net/10356/162146
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Institution: Nanyang Technological University
Language: English
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