A physics-based model for crystal orientation dictionary indexing by directional reflectance microscopy

• المؤلفون الرئيسيون: Zhu, Chenyang, Seita, Matteo
• مؤلفون آخرون: School of Mechanical and Aerospace Engineering
• التنسيق: مقال
• اللغة: English
• منشور في: 2022
• الموضوعات: Engineering::Mechanical engineering; Engineering::Materials; Directional Reflectance Microscopy; Crystal Orientation Mapping
• الوصول للمادة أونلاين: https://hdl.handle.net/10356/162146
• المؤسسة: Nanyang Technological University

Directional reflectance microscopy (DRM) is a new optical technique that enables grain orientation mapping in crystalline solids by capturing and analyzing light reflectance signals generated by chemically etched surfaces. Currently, orientation indexing by DRM relies on fitting the optical signals...