Enhanced machine learning aided RF-SOI EDMOS reliability prediction

• المؤلف الرئيسي: Luo, Jie
• مؤلفون آخرون: Ang Diing Shenp
• التنسيق: Final Year Project
• اللغة: English
• منشور في: Nanyang Technological University 2023
• الموضوعات: Engineering::Electrical and electronic engineering
• الوصول للمادة أونلاين: https://hdl.handle.net/10356/166813

The reliability of Radio Frequency Silicon-On-Insulator (RF-SOI) Lateral Extended Drain Mental-Oxide-Semiconductor Field-effect Transistor (EDMOS) is crucial for ensuring the performance and longevity of high-performance electronic devices as they are the fundamental building blocks of those devices...