Enhanced machine learning aided RF-SOI EDMOS reliability prediction

The reliability of Radio Frequency Silicon-On-Insulator (RF-SOI) Lateral Extended Drain Mental-Oxide-Semiconductor Field-effect Transistor (EDMOS) is crucial for ensuring the performance and longevity of high-performance electronic devices as they are the fundamental building blocks of those devices...

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Bibliographic Details
Main Author: Luo, Jie
Other Authors: Ang Diing Shenp
Format: Final Year Project
Language:English
Published: Nanyang Technological University 2023
Subjects:
Online Access:https://hdl.handle.net/10356/166813
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Institution: Nanyang Technological University
Language: English

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