Machine learning approach for wafer frontend test yield loss prediction

• Main Author: Zhong, Qinhong
• Other Authors: Wang Hong
• Format: Thesis-Master by Coursework
• Language: English
• Published: Nanyang Technological University 2023
• Subjects: Engineering::Electrical and electronic engineering::Microelectronics
• Online Access: https://hdl.handle.net/10356/166864
• Institution: Nanyang Technological University

Nowadays, as automation and digitalization are deeply integrated into the semiconductor industry, a tremendous amount of data generated from IC Design to Final Test plays a vital role in boosting innovation and productivity. The interval time between fabrication and testing could be a few weeks...