Machine learning approach for wafer frontend test yield loss prediction
Nowadays, as automation and digitalization are deeply integrated into the semiconductor industry, a tremendous amount of data generated from IC Design to Final Test plays a vital role in boosting innovation and productivity. The interval time between fabrication and testing could be a few weeks...
Saved in:
| Main Author: | |
|---|---|
| Other Authors: | |
| Format: | Thesis-Master by Coursework |
| Language: | English |
| Published: |
Nanyang Technological University
2023
|
| Subjects: | |
| Online Access: | https://hdl.handle.net/10356/166864 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Institution: | Nanyang Technological University |
| Language: | English |