Modeling of test structures for applications in EM shielding

• Main Author: Lim, York Ying
• Other Authors: Tay Beng Kang
• Format: Final Year Project
• Language: English
• Published: 2015
• Subjects: DRNTU::Engineering::Electrical and electronic engineering::Microelectronics
• Online Access: http://hdl.handle.net/10356/63854
• Institution: Nanyang Technological University

The next generation of components and devices are reduced in size, which makes the circuit more compact that will affect the signal integrity. One of the current techniques used for RF isolation is by implementing via fence guard trace in compact circuitries to isolate near end interference. However...