Modeling of test structures for applications in EM shielding

The next generation of components and devices are reduced in size, which makes the circuit more compact that will affect the signal integrity. One of the current techniques used for RF isolation is by implementing via fence guard trace in compact circuitries to isolate near end interference. However...

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Main Author: Lim, York Ying
Other Authors: Tay Beng Kang
Format: Final Year Project
Language:English
Published: 2015
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Online Access:http://hdl.handle.net/10356/63854
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Institution: Nanyang Technological University
Language: English
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spelling sg-ntu-dr.10356-638542023-07-07T16:27:12Z Modeling of test structures for applications in EM shielding Lim, York Ying Tay Beng Kang School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering::Microelectronics The next generation of components and devices are reduced in size, which makes the circuit more compact that will affect the signal integrity. One of the current techniques used for RF isolation is by implementing via fence guard trace in compact circuitries to isolate near end interference. However, it is not possible to reduce the distance between guard trace and transmission lines without affecting the level of crosstalk isolation. In recent years, carbon nanotubes (CNTs) are attractive in circuit devices for electromagnetic interference shielding due to its high current density, flexibility, high tensile strength and high thermal conductivity. In this work, design test structures of microstrip, guard trace and guard trace with CNT wall were modeled and simulated. Simulations of CNTs are limited to 1 mm in this scope of work. Additional of a thin layer of metal on the CNT wall shown improvement in crosstalk isolation. Another simulation was done with CNT lid and Ag lid, SE differences were observed from 1-15 GHz. Bachelor of Engineering 2015-05-19T07:20:54Z 2015-05-19T07:20:54Z 2015 2015 Final Year Project (FYP) http://hdl.handle.net/10356/63854 en Nanyang Technological University 60 p. application/pdf
institution Nanyang Technological University
building NTU Library
continent Asia
country Singapore
Singapore
content_provider NTU Library
collection DR-NTU
language English
topic DRNTU::Engineering::Electrical and electronic engineering::Microelectronics
spellingShingle DRNTU::Engineering::Electrical and electronic engineering::Microelectronics
Lim, York Ying
Modeling of test structures for applications in EM shielding
description The next generation of components and devices are reduced in size, which makes the circuit more compact that will affect the signal integrity. One of the current techniques used for RF isolation is by implementing via fence guard trace in compact circuitries to isolate near end interference. However, it is not possible to reduce the distance between guard trace and transmission lines without affecting the level of crosstalk isolation. In recent years, carbon nanotubes (CNTs) are attractive in circuit devices for electromagnetic interference shielding due to its high current density, flexibility, high tensile strength and high thermal conductivity. In this work, design test structures of microstrip, guard trace and guard trace with CNT wall were modeled and simulated. Simulations of CNTs are limited to 1 mm in this scope of work. Additional of a thin layer of metal on the CNT wall shown improvement in crosstalk isolation. Another simulation was done with CNT lid and Ag lid, SE differences were observed from 1-15 GHz.
author2 Tay Beng Kang
author_facet Tay Beng Kang
Lim, York Ying
format Final Year Project
author Lim, York Ying
author_sort Lim, York Ying
title Modeling of test structures for applications in EM shielding
title_short Modeling of test structures for applications in EM shielding
title_full Modeling of test structures for applications in EM shielding
title_fullStr Modeling of test structures for applications in EM shielding
title_full_unstemmed Modeling of test structures for applications in EM shielding
title_sort modeling of test structures for applications in em shielding
publishDate 2015
url http://hdl.handle.net/10356/63854
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