The test development of 32-bit micro-controller
The dissertation will present the test development flow, from DFT (Design For Test) concept, to test program implemented on the ATE (Automatic Test Equipment), which includes DFT concept, test pattern generation, conversion, simulation and integrated the test program on Teradyne 5750 tester. The ATP...
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| Format: | Theses and Dissertations |
| Published: |
2008
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| Online Access: | http://hdl.handle.net/10356/4341 |
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| Institution: | Nanyang Technological University |