The test development of 32-bit micro-controller

The dissertation will present the test development flow, from DFT (Design For Test) concept, to test program implemented on the ATE (Automatic Test Equipment), which includes DFT concept, test pattern generation, conversion, simulation and integrated the test program on Teradyne 5750 tester. The ATP...

Full description

Saved in:

Bibliographic Details
Main Author:	Hao, Juan.
Other Authors:	Wong, Eddie Moon Chung
Format:	Theses and Dissertations
Published:	2008
Subjects:	DRNTU::Engineering::Electrical and electronic engineering::Microelectronics
Online Access:	http://hdl.handle.net/10356/4341
Tags:	Add Tag No Tags, Be the first to tag this record!
Institution:	Nanyang Technological University

id	sg-ntu-dr.10356-4341
record_format	dspace
spelling	sg-ntu-dr.10356-43412023-07-04T15:57:51Z The test development of 32-bit micro-controller Hao, Juan. Wong, Eddie Moon Chung School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering::Microelectronics The dissertation will present the test development flow, from DFT (Design For Test) concept, to test program implemented on the ATE (Automatic Test Equipment), which includes DFT concept, test pattern generation, conversion, simulation and integrated the test program on Teradyne 5750 tester. The ATPG SCAN test coverage for production test is more than 98%. Furthermore, AC characterization implementation on Teradyne 5750 tester will be discussed to satisfy customer’s requirements and ATE testing environment. Master of Science (Microelectronics) 2008-09-17T09:49:34Z 2008-09-17T09:49:34Z 2004 2004 Thesis http://hdl.handle.net/10356/4341 Nanyang Technological University application/pdf
institution	Nanyang Technological University
building	NTU Library
continent	Asia
country	Singapore Singapore
content_provider	NTU Library
collection	DR-NTU
topic	DRNTU::Engineering::Electrical and electronic engineering::Microelectronics
spellingShingle	DRNTU::Engineering::Electrical and electronic engineering::Microelectronics Hao, Juan. The test development of 32-bit micro-controller
description	The dissertation will present the test development flow, from DFT (Design For Test) concept, to test program implemented on the ATE (Automatic Test Equipment), which includes DFT concept, test pattern generation, conversion, simulation and integrated the test program on Teradyne 5750 tester. The ATPG SCAN test coverage for production test is more than 98%. Furthermore, AC characterization implementation on Teradyne 5750 tester will be discussed to satisfy customer’s requirements and ATE testing environment.
author2	Wong, Eddie Moon Chung
author_facet	Wong, Eddie Moon Chung Hao, Juan.
format	Theses and Dissertations
author	Hao, Juan.
author_sort	Hao, Juan.
title	The test development of 32-bit micro-controller
title_short	The test development of 32-bit micro-controller
title_full	The test development of 32-bit micro-controller
title_fullStr	The test development of 32-bit micro-controller
title_full_unstemmed	The test development of 32-bit micro-controller
title_sort	test development of 32-bit micro-controller
publishDate	2008
url	http://hdl.handle.net/10356/4341
_version_	1772828813814661120

The test development of 32-bit micro-controller

Similar Items