Experimental study of the impact of process variation on Internal Latchup (ILU) in 130nm technologies and statistical data analysis for performance optimization

• Main Author: Brijesh Mayurkumar Shah
• Other Authors: Poenar Daniel Puiu
• Format: Final Year Project
• Language: English
• Published: Nanyang Technological University 2023
• Subjects: Engineering::Electrical and electronic engineering
• Online Access: https://hdl.handle.net/10356/167330
• Institution: Nanyang Technological University

Semiconductor devices are the backbone of the technological revolution. There would be no digital devices without a chip. As such it is important to identify the root of device failures, such that they can be worked on to come up with the solution. When semiconductor devices were first invented, one...