Experimental study of the impact of process variation on Internal Latchup (ILU) in 130nm technologies and statistical data analysis for performance optimization

Semiconductor devices are the backbone of the technological revolution. There would be no digital devices without a chip. As such it is important to identify the root of device failures, such that they can be worked on to come up with the solution. When semiconductor devices were first invented, one...

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Bibliographic Details
Main Author: Brijesh Mayurkumar Shah
Other Authors: Poenar Daniel Puiu
Format: Final Year Project
Language:English
Published: Nanyang Technological University 2023
Subjects:
Online Access:https://hdl.handle.net/10356/167330
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Institution: Nanyang Technological University
Language: English

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