Experimental study of the impact of process variation on Internal Latchup (ILU) in 130nm technologies and statistical data analysis for performance optimization

• 主要作者: Brijesh Mayurkumar Shah
• 其他作者: Poenar Daniel Puiu
• 格式: Final Year Project
• 語言: English
• 出版: Nanyang Technological University 2023
• 主題: Engineering::Electrical and electronic engineering
• 在線閱讀: https://hdl.handle.net/10356/167330
• 機構: Nanyang Technological University

Semiconductor devices are the backbone of the technological revolution. There would be no digital devices without a chip. As such it is important to identify the root of device failures, such that they can be worked on to come up with the solution. When semiconductor devices were first invented, one...