Algorithmic feature detection and statistical analysis in scanning probe microscopy data
Scanning Probe Microscopy has seen various advancements in recent years in terms of its imaging resolution, allowing researchers to image surfaces and particles on the atomic level. However, despite these advancements, the data acquisition processes undertaken in various fields are highly based on u...
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| 格式: | Final Year Project |
| 語言: | English |
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Nanyang Technological University
2023
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| 在線閱讀: | https://hdl.handle.net/10356/167521 |
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| 機構: | Nanyang Technological University |
| 語言: | English |