Algorithmic feature detection and statistical analysis in scanning probe microscopy data

• Main Author: Toh, Jeremy Wee Siang
• Other Authors: Kedar Hippalgaonkar
• Format: Final Year Project
• Language: English
• Published: Nanyang Technological University 2023
• Subjects: Engineering::Materials
• Online Access: https://hdl.handle.net/10356/167521
• Institution: Nanyang Technological University

Scanning Probe Microscopy has seen various advancements in recent years in terms of its imaging resolution, allowing researchers to image surfaces and particles on the atomic level. However, despite these advancements, the data acquisition processes undertaken in various fields are highly based on u...