Algorithmic feature detection and statistical analysis in scanning probe microscopy data

Scanning Probe Microscopy has seen various advancements in recent years in terms of its imaging resolution, allowing researchers to image surfaces and particles on the atomic level. However, despite these advancements, the data acquisition processes undertaken in various fields are highly based on u...

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Bibliographic Details
Main Author: Toh, Jeremy Wee Siang
Other Authors: Kedar Hippalgaonkar
Format: Final Year Project
Language:English
Published: Nanyang Technological University 2023
Subjects:
Online Access:https://hdl.handle.net/10356/167521
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Institution: Nanyang Technological University
Language: English

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