Algorithmic feature detection and statistical analysis in scanning probe microscopy data

• المؤلف الرئيسي: Toh, Jeremy Wee Siang
• مؤلفون آخرون: Kedar Hippalgaonkar
• التنسيق: Final Year Project
• اللغة: English
• منشور في: Nanyang Technological University 2023
• الموضوعات: Engineering::Materials
• الوصول للمادة أونلاين: https://hdl.handle.net/10356/167521

Scanning Probe Microscopy has seen various advancements in recent years in terms of its imaging resolution, allowing researchers to image surfaces and particles on the atomic level. However, despite these advancements, the data acquisition processes undertaken in various fields are highly based on u...