An optodigital system for visualizing the leaf epidermal surface using embedded speckle SIM: a 3D non-destructive approach
Intricate characterisation of the leaf epidermal surface is of utmost importance in agricultural crop management. The epidermal surface serves as a plant's outermost interface with the environment and is responsible for several physiological functions such as, balancing plant metabolism, regula...
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sg-ntu-dr.10356-1699912024-01-27T16:48:02Z An optodigital system for visualizing the leaf epidermal surface using embedded speckle SIM: a 3D non-destructive approach Antony, Maria Merin Haridas, Aswin Suchand Sandeep, Chandramathi Sukumaran Vadakke Matham, Murukeshan School of Mechanical and Aerospace Engineering Centre for Optical and Laser Engineering Science::Physics::Optics and light Leaf Epidermis Microscopy Speckle Automation SIM Intricate characterisation of the leaf epidermal surface is of utmost importance in agricultural crop management. The epidermal surface serves as a plant's outermost interface with the environment and is responsible for several physiological functions such as, balancing plant metabolism, regulating photosynthesis rate, and controlling plant-pathogen interactions. Existing microscopic techniques for large-scale, high-resolution characterisation of epidermal surfaces are in general destructive and time consuming, allowing only a single time point to be measured per sample. Here, the first time use of embedded speckle structured illumination microscope (ES-SIM) for the non-destructive characterisation of plant epidermal surface is reported. The developed optodigital system and analysis algorithm can enable automated characterisation of epidermal surface at multiple time points. The effectiveness of the proposed method for accurate detection of necrosis through 3D surface profiling of the leaf epidermis of a traditional medicinal plant, Piper sarmentosum, is demonstrated. ES-SIM provided 2.2 times better sensitivity for necrosis detection in comparison to conventional microscopy. National Research Foundation (NRF) Submitted/Accepted version This research is supported by the National Research Foundation, Singapore and Singapore Food Agency, under its Singapore Food Story R&D Programme (Theme 1: Sustainable Urban Food Production) Grant Call (SFS_RND_SUFP_001_03). 2023-08-21T01:42:02Z 2023-08-21T01:42:02Z 2023 Journal Article Antony, M. M., Haridas, A., Suchand Sandeep, C. S. & Vadakke Matham, M. (2023). An optodigital system for visualizing the leaf epidermal surface using embedded speckle SIM: a 3D non-destructive approach. Computers and Electronics in Agriculture, 211, 107962-. https://dx.doi.org/10.1016/j.compag.2023.107962 0168-1699 https://hdl.handle.net/10356/169991 10.1016/j.compag.2023.107962 2-s2.0-85162183889 211 107962 en SFS_RND_SUFP_001_03 Computers and Electronics in Agriculture © 2023 Elsevier B.V. All rights reserved. This article may be downloaded for personal use only. Any other use requires prior permission of the copyright holder. The Version of Record is available online at http://doi.org/10.1016/j.compag.2023.107962. application/pdf |
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Science::Physics::Optics and light Leaf Epidermis Microscopy Speckle Automation SIM Antony, Maria Merin Haridas, Aswin Suchand Sandeep, Chandramathi Sukumaran Vadakke Matham, Murukeshan An optodigital system for visualizing the leaf epidermal surface using embedded speckle SIM: a 3D non-destructive approach |
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Intricate characterisation of the leaf epidermal surface is of utmost importance in agricultural crop management. The epidermal surface serves as a plant's outermost interface with the environment and is responsible for several physiological functions such as, balancing plant metabolism, regulating photosynthesis rate, and controlling plant-pathogen interactions. Existing microscopic techniques for large-scale, high-resolution characterisation of epidermal surfaces are in general destructive and time consuming, allowing only a single time point to be measured per sample. Here, the first time use of embedded speckle structured illumination microscope (ES-SIM) for the non-destructive characterisation of plant epidermal surface is reported. The developed optodigital system and analysis algorithm can enable automated characterisation of epidermal surface at multiple time points. The effectiveness of the proposed method for accurate detection of necrosis through 3D surface profiling of the leaf epidermis of a traditional medicinal plant, Piper sarmentosum, is demonstrated. ES-SIM provided 2.2 times better sensitivity for necrosis detection in comparison to conventional microscopy. |
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School of Mechanical and Aerospace Engineering |
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School of Mechanical and Aerospace Engineering Antony, Maria Merin Haridas, Aswin Suchand Sandeep, Chandramathi Sukumaran Vadakke Matham, Murukeshan |
format |
Article |
author |
Antony, Maria Merin Haridas, Aswin Suchand Sandeep, Chandramathi Sukumaran Vadakke Matham, Murukeshan |
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Antony, Maria Merin |
title |
An optodigital system for visualizing the leaf epidermal surface using embedded speckle SIM: a 3D non-destructive approach |
title_short |
An optodigital system for visualizing the leaf epidermal surface using embedded speckle SIM: a 3D non-destructive approach |
title_full |
An optodigital system for visualizing the leaf epidermal surface using embedded speckle SIM: a 3D non-destructive approach |
title_fullStr |
An optodigital system for visualizing the leaf epidermal surface using embedded speckle SIM: a 3D non-destructive approach |
title_full_unstemmed |
An optodigital system for visualizing the leaf epidermal surface using embedded speckle SIM: a 3D non-destructive approach |
title_sort |
optodigital system for visualizing the leaf epidermal surface using embedded speckle sim: a 3d non-destructive approach |
publishDate |
2023 |
url |
https://hdl.handle.net/10356/169991 |
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1789483105091846144 |